LP2996AMRSLASHNOPB datasheet(5/29 Pages) TI1

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LP2996A

www.ti.com

SNOSCY7 – JUNE 2014

6.4 Thermal Information

SO PowerPAD-8 DDA

THERMAL METRIC(1)(2)(3)

UNIT

8 PINS

RθJA

Junction-to-ambient thermal resistance

56.5

RθJC(top)

Junction-to-case (top) thermal resistance

65.1

RθJB

Junction-to-board thermal resistance

36.5

°C/W

ψJT

Junction-to-top characterization parameter

15.9

ψJB

Junction-to-board characterization parameter

36.5

RθJC(bot)

Junction-to-case (bottom) thermal resistance

8.4

(1)

For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.

(2)

The package thermal impedance is calculated in accordance with JESD 51-7

(3)

Thermal Resistances were simulated on a 4 layer, JEDEC board.

6.5 Electrical Characteristics

Specifications are for TJ = 25°C and apply over the full Operating Temperature Range (TJ = 0°C to +125°C)

(1). Unless

otherwise specified, AVIN = PVIN = 2.5V, VDDQ = 2.5V

(2).

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VREF voltage (DDR I)

VIN = VDDQ = 2.3 V

1.135

1.158

1.185

VIN = VDDQ = 2.5 V

1.235

1.258

1.285

VIN = VDDQ = 2.7 V

1.335

1.358

1.385

VREF voltage (DDR II)

PVIN = VDDQ = 1.7 V

0.837

0.860

0.887

VREF

PVIN = VDDQ = 1.8 V

0.887

0.910

0.937

PVIN = VDDQ = 1.9 V

0.936

0.959

0.986

VREF Voltage (DDR III)

PVIN = VDDQ = 1.35V

0.669

0.684

0.699

PVIN = VDDQ = 1.5V

0.743

0.758

0.773

PVIN = VDDQ = 1.6V

0.793

0.808

0.823

ZVREF

VREF Output Impedance

IREF = –30 to +30 µA

2.5

Ω

VTT

VTT Output Voltage (DDR I)

(3)

IOUT = 0 A

VIN = VDDQ = 2.3 V

1.120

1.159

1.190

VIN = VDDQ = 2.5 V

1.210

1.259

1.290

VIN = VDDQ = 2.7 V

1.320

1.359

1.390

IOUT = +/– 1.5 A

VIN = VDDQ = 2.3 V

1.125

1.159

1.190

VIN = VDDQ = 2.5 V

1.225

1.259

1.290

VIN = VDDQ = 2.7 V

1.325

1.359

1.390

VTT Output Voltage (DDR II)

(3)

IOUT = 0 A, AVIN = 2.5 V

PVIN = VDDQ = 1.7 V

0.822

0.856

0.887

PVIN = VDDQ = 1.8 V

0.874

0.908

0.939

PVIN = VDDQ = 1.9 V

0.923

0.957

0.988

IOUT = +/– 0.5A, AVIN = 2.5 V

PVIN = VDDQ = 1.7 V

0.820

0.856

0.890

PVIN = VDDQ = 1.8 V

0.870

0.908

0.940

PVIN = VDDQ = 1.9 V

0.920

0.957

0.990

(1)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using

Statistical Quality Control (SQC) methods. The limits are used to calculate Texas Instruments' Average Outgoing Quality Level (AOQL).

(2)

VIN is defined as VIN = AVIN = PVIN.

(3)

VTT load regulation is tested by using a 10 ms current pulse and measuring VTT.

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