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TLK1201ARCP Datasheet(PDF) 13 Page - Texas Instruments |
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TLK1201ARCP Datasheet(HTML) 13 Page - Texas Instruments |
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13 / 24 page ![]() www.ti.com CL 5 pF CL 5 pF 50 Ω 50 Ω LVTTL OUTPUT SWITCHING CHARACTERISTICS tr tf CLOCK 80% 50% 20% tr tf 2 V 0.8 V DATA 1.4 V TRANSMITTER TIMING REQUIREMENTS TLK1201ARCP, TLK1201AIRCP ETHERNET TRANSCEIVERS SLLS580D – FEBRUARY 2004 – REVISED SEPTEMBER 2007 Figure 8. Transmitter Test Setup over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tr(RBC) Clock rise time 0.3 1.5 ns tf(RBC) Clock fall time 0.3 1.5 80% to 20% output voltage, C = 5 pF (see Figure 9) tr Data rise time 0.3 1.5 ns tf Data fall time 0.3 1.5 TBI normal mode, (see Figure 3), Rω = 125 MHz 2.5 Data setup time (RD0–RD9), Data tsu(D1) ns valid prior to RBC0 rising TBI normal mode, (see Figure 3), Rω = 61.44 MHz 5 TBI normal mode, (see Figure 3), Rω = 125 MHz 2 Data hold time (RD0–RD9), Data valid th(D1) ns after RBC0 rising TBI normal mode, (see Figure 3), Rω = 61.44 MHz 4 tsu(D2) Data setup time (RD0–RD4) DDR mode, Rω = 125 MHz, (see Figure 4) 2 ns th(D2) Data hold time (RD0–RD4) DDR mode, Rω = 125 MHz, (see Figure 4) 0.8 ns tsu(D3) Data setup time (RD0–RD9) TBI half-rate mode, Rω = 125 MHz, (see Figure 2) 2.5 ns th(D3) Data hold time (RD0–RD9) TBI half-rate mode, Rω = 125 MHz, (see Figure 2) 1.5 ns Figure 9. TTL Data I/O Valid Levels for AC Measurement over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tsu(D4) Data setup time (TD0–TD9) 1.6 TBI modes ns th(D4) Data hold time (TD0–TD9) 0.8 tsu(D5) Data setup time (TD0–TD9) 0.7 DDR modes ns th(D5) Data hold time (TD0–TD9) 0.5 tr, tf TD[0,9] data rise and fall time See Figure 9 2 ns Copyright © 2004–2007, Texas Instruments Incorporated Submit Documentation Feedback 13 Product Folder Link(s): TLK1201ARCP TLK1201AIRCP |
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