SN54F240, SN74F240

OCTAL BUFFERS/DRIVERS

WITH 3-STATE OUTPUTS

SDFS061A – D2932, MARCH 1987 – REVISED OCTOBER 1993

Copyright

2–1

POST OFFICE BOX 655303

Memory Address Registers

Small-Outline (SOIC) and Shrink

Small-Outline (SSOP) Packages, Ceramic

Chip Carriers, and Plastic and Ceramic

DIPs

description

These octal buffers and line drivers are designed

specifically to improve both the performance and

density of 3-state memory address drivers, clock

drivers,

and

bus-oriented

receivers

and

transmitters. Taken together with the

′F241 and

′F244, these devices provide the choice of

selected

combinations

of

inverting

and

noninverting outputs, symmetrical OE (active-low

output-enable) inputs, and complementary OE

and OE inputs.

The

′F240 is organized as two 4-bit buffers/line

drivers with separate output enable (OE) inputs.

When OE is low, the device passes data from the

A inputs to the Y outputs. When OE is high, the

outputs are in the high-impedance state.

The SN74F240 is available in TI’s shrink

small-outline package (DB), which provides the

same I/O pin count and functionality of standard

small-outline packages in less than half the

printed-circuit-board area.

The SN54F240 is characterized for operation over

the full military temperature range of – 55

°C to

125

°C. The SN74F240 is characterized for

operation from 0

°C to 70°C.

FUNCTION TABLE

(each buffer)

INPUTS

OUTPUT

OE

A

Y

L

H

L

L

LH

H

X

Z

1

2

3

4

5

6

7

8

9

10

20

19

18

17

16

15

14

13

12

11

1OE

1A1

2Y4

1A2

2Y3

1A3

2Y2

1A4

2Y1

GND

2OE

1Y1

2A4

1Y2

2A3

1Y3

2A2

1Y4

2A1

SN54F240 ...J PACKAGE

SN74F240 . . . DB, DW, OR N PACKAGE

(TOP VIEW)

32

1 20 19

910 11 12 13

4

5

6

7

8

18

17

16

15

14

1Y1

2A4

1Y2

2A3

1Y3

1A2

2Y3

1A3

2Y2

1A4

SN54F240 . . . FK PACKAGE

(TOP VIEW)

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.