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DS90CF581 Datasheet(PDF) 5 Page - National Semiconductor (TI) |
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DS90CF581 Datasheet(HTML) 5 Page - National Semiconductor (TI) |
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5 / 10 page ![]() AC Timing Diagrams (Continued) DS012486-16 Note 7: The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and CMOS/TTL I/O. Note 8: The 16 grayscale test pattern tests device power consumption for a “typical” LCD display pattern. The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display. Note 9: Figure 1 and Figure 2 show a falling edge data strobe (TxCLK IN/RxCLK OUT). Note 10: Recommended pin to signal mapping. Customer may choose to define differently. FIGURE 2. “16 GRAYSCALE” Test Pattern (Notes 7, 8, 9, 10) DS012486-8 DS012486-9 FIGURE 3. DS90CF581 (Transmitter) LVDS Output Load and Transition Timing www.national.com 5 |
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