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TSS461CVAN Datasheet(PDF) 16 Page - TEMIC Semiconductors |
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TSS461CVAN Datasheet(HTML) 16 Page - TEMIC Semiconductors |
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16 / 24 page ![]() Qualpack TS80C31X2/C32X2 16 Rev. 2 – January 1999 4.5 Device Qualification This section presents TSS463 and TSS461C device qualification results, including additional measurements intending to fulfil Q100 Automotive Standard requirements. Lot Number Device Type Test Description Step Resul t Comment Z21538F TSS463 in SO 16 EFR Dynamic Life Test 12h 0/261 LFR Dynamic Life Test 500h 1000h 0/116 0/116 Z21997 TSS463 in SO 16 EFR Dynamic Life Test 12h 48h 0/800 0/304 LFR Dynamic Life Test 500h 1000h 0/45 0/45 (6) W28184C 29C461B in SO 24 EFR Dynamic Life Test 12h 0/298 LFR Dynamic Life Test 500h 1000h 0/72 0/72 Z04948C TSS461C in SO 24 EFR Dynamic Life Test 12h 0/296 LFR Dynamic Life Test 500h 1000h 0/78 0/78 Global All products EFR Dynamic Life Test 12h 0/1655 0 ppm measured LFR Dynamic Life Test 500h 1000h 0/311 0/311 18 fit measured Notes: (6) Electrical test with Quality program at 25°c, 125°c and -40°c |
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