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VN7004CLHTR Datasheet(PDF) 9 Page - STMicroelectronics

Part # VN7004CLHTR
Description  High-side driver with CurrentSense analog feedback for automotive applications
PDF  36 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

VN7004CLHTR Datasheet(HTML) 9 Page - STMicroelectronics

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VN7004CLH
Electrical specification
DocID027770 Rev 5
9/36
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISTBY
Supply current in
standby at VCC = 13 V (1)
VCC = 13 V;
VIN = VOUT = VFR_DIAG = 0 V;
Tj = 25°C
0.5
µA
VCC = 13 V;
VIN = VOUT = VFR_DIAG = 0 V;
Tj = 85°C (2)
1.4
VCC = 13 V;
VIN = VOUT = VFR_DIAG = 0 V;
Tj = 125°C
11
tD_STBY
Standby mode blanking
time
VCC = 13 V; VIN = 5 V;
VFR_DIAG = 0 V; IOUT = 0 A
60
300
550
µs
IS(ON)
Supply current
VCC = 13 V; VFR_DIAG = 0 V;
VIN = 5 V; IOUT = 0 A
4
6.5
mA
IGND(ON)
Control stage current
consumption in ON
state. All channels
active.
VCC = 13 V; VFR_DIAG = 5 V;
VIN = 5 V; IOUT = 15 A
9
mA
IL(off)
Off-state output current
at VCC = 13 V
VIN = VOUT = 0 V; VCC = 13 V;
Tj = 25°C
0
0.01
0.5
µA
VIN = VOUT = 0 V; VCC = 13 V;
Tj = 125°C
0
11
VF
Output - VCC diode
voltage
IOUT = -15 A; Tj = 150°C
0.7
V
Notes:
(1)PowerMOS leakage included.
(2)Parameter specified by design; not subject to production test.
Table 7: Switching
VCC = 13 V; -40°C < Tj < 150°C, unless otherwise specified
Symbol
Parameter
Test
conditions
Min.
Typ.
Max.
Unit
td(on)(1)
Turn-on delay time at Tj = 25 °C
RL =
0.87 Ω
10
50
120
µs
td(off)(1)
Turn-off delay time at Tj = 25 °C
10
60
100
(dVOUT/dt)on(1)
Turn-on voltage slope at Tj = 25 °C
RL =
0.87 Ω
0.075
0.28
0.7
V/µs
(dVOUT/dt)off(1)
Turn-off voltage slope at Tj = 25 °C
0.075
0.33
0.7
WON
Switching energy losses at turn-on
(twon)
RL =
0.87 Ω
—
1.8
3.6(2)
mJ
WOFF
Switching energy losses at turn-off
(twoff)
RL =
0.87 Ω
—
2
3.6(2)
mJ
tSKEW(1)
Differential Pulse skew (tPHL - tPLH)
RL =
0.87 Ω
-50
0
50
µs
Notes:
(1)See Figure 6: "Switching times and Pulse skew".
(2)Parameter guaranteed by design and characterization; not subject to production test.



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