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TPC8001 Datasheet(PDF) 3 Page - Toshiba Semiconductor |
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TPC8001 Datasheet(HTML) 3 Page - Toshiba Semiconductor |
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3 / 7 page ![]() TPC8001 2002-02-06 3 Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Gate leakage current IGSS VGS = ±16 V, VDS = 0 V — ― ±10 µA Drain cut−off current IDSS VDS = 30 V, VGS = 0 V ― ― 10 µA Drain−source breakdown voltage V (BR) DSS ID = 10 mA, VGS = 0 V 30 ― ― V Gate threshold voltage Vth VDS = 10 V, ID = 1 mA 0.8 ― 2.0 V RDS (ON) VGS = 4 V, ID = 3.5 A ― 25 30 mΩ Drain−source ON resistance RDS (ON) VGS = 10 V, ID = 3.5 A ― 16 20 mΩ Forward transfer admittance |Yfs| VDS = 10 V, ID = 3.5 A 5.5 11 ― S Input capacitance Ciss ― 1250 ― Reverse transfer capacitance Crss ― 190 ― Output capacitance Coss VDS = 10 V, VGS = 0 V, f = 1 MHz ― 760 ― pF Rise time tr ― 9 ― Turn−on time ton ― 17 ― Fall time tf ― 24 ― Switching time Turn−off time toff ― 100 ― ns Total gate charge (Gate−source plus gate−drain) Qg ― 40 ― Gate−source charge Qgs ― 27 ― Gate−drain (“miller”) charge Qgd VDD ≈ 24 V, VGS = 10 V, ID = 7 A ― 13 ― nC Source−Drain Ratings and Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Drain reverse current Pulse (Note 1) IDRP — — — 28 A Forward voltage (diode) VDSF IDR = 7 A, VGS = 0 V — — −1.2 V |
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