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DRV401AIDWPR Datasheet(PDF) 2 Page - Texas Instruments |
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DRV401AIDWPR Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 36 page  DRV401 SBVS070B − JUNE 2006 − REVISED MAY 2009 www.ti.com 2 ABSOLUTE MAXIMUM RATINGS(1) Supply Voltage +7V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Signal Input Terminals: Voltage(2) −0.5V to VDD + 0.5V . . . . . . . . . . . . . . . . . . . . . . . . . . . Differential Amplifier(3) −10V to +10V . . . . . . . . . . . . . . . . . . . . . . Current at IS1 and IS2 ±75mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Current (pins other than IS1 and IS2)(2) ±25mA . . . . . . . . . . . . . . ICOMP Short Circuit(4) +250mA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating Junction Temperature −50 °C to +150°C . . . . . . . . . . . . . Storage Temperature −55 °C to +150°C . . . . . . . . . . . . . . . . . . . . . . . ESD Rating: Human Body Model (HBM) Pins IAIN1 and IAIN2 Only 1kV . . . . . . . . . . . . . . . . . . . . . . . . . . . All Other Pins 4kV . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not supported. (2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails must be current limited, except for the differential amplifier input pins. (3) These inputs are not internally protected against over voltage. The differential amplifier input pins must be limited to 5mA, max or ±10V, max. (4) Power-limited; observe maximum junction temperature. This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING DRV401 QFN-20 (5mm x 5mm) RGW HAAQ DRV401 SO-20 DWP DRV401A (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. |
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