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AS6C2008A Datasheet(PDF) 5 Page - Alliance Semiconductor Corporation |
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AS6C2008A Datasheet(HTML) 5 Page - Alliance Semiconductor Corporation |
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5 / 15 page ![]() AC ELECTRICAL CHARACTERISTICS (1) READ CYCLE AS6C2008A-55 PARAMETER SYM. UNIT Read Cycle Time tRC Address Access Time tAA Chip Enable Access Time tACE Output Enable Access Time tOE Chip Enable to Output in Low-Z tCLZ Output Enable to Output in Low-Z tOLZ Chip Disable to Output in High-Z tCHZ Output Disable to Output in High-Z tOHZ Output Hold from Address Change tOH (2) WRITE CYCLE AS6C2008A-55 PARAMETER SYM. UNIT Write Cycle Time tWC Address Valid to End of Write tAW Chip Enable to End of Write tCW Address Set-up Time tAS Write Pulse Width tWP Write Recovery Time tWR Data to Write Time Overlap tDW Data Hold from End of Write Time tDH Output Active from End of Write tOW Write to Output in High-Z tWHZ *These parameters are guaranteed by device characterization, but not production tested. 512K X 8 BIT LOW POWER CMOS SRAM January 2007 256K X 8 BIT LOW POWER CMOS SRAM AUGUST 2007 AS6C2008A AUGUST/2007, V 1.0 Alliance Memory Inc. Page 5 of 15 |
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