ADS809

2

SBAS170C

www.ti.com

ELECTRICAL CHARACTERISTICS

ADS809Y

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

RESOLUTION

12 Tested

Bits

SPECIFIED TEMPERATURE RANGE

Ambient Air

–40 to +85

°C

ANALOG INPUT

Standard Differential Input Range

(1Vp-p • 2, +10dBm)

1

2

V

Single-Ended Input Voltage

1Vp-p

2

3

V

Common-Mode Voltage

2.5

V

Optional Input Ranges

Selectable

1Vp-p or 1.5Vp-p

V

Analog Input Bias Current

1

µA

Track-Mode Input Bandwidth

–3dBFS

1

GHz

Input Impedance

Static, No Clock

1.25 || 9

M

Ω || pF

CONVERSION CHARACTERISTICS

Sample Rate

1M

80M

Samples/s

Data Latency

5

Clk Cyc

DYNAMIC CHARACTERISTICS

Differential Linearity Error (largest code error)

f = 1MHz

±0.7

+1.7/–1.0

LSB

f = 10MHz

±0.7

LSB

No Missing Codes

Tested

Integral Nonlinearity Error, f = 1MHz

±4.0

±7.0

LSBs

f = 1MHz

71

f = 10MHz

65

68

dBFS

f = 31MHz

67

dBFS

2-Tone Intermodulation Distortion

–77

dBFS

Signal-to-Noise Ratio (SNR)

f = 1MHz

65.5

dBFS

f = 10MHz

65

dBFS

f = 31MHz

63

dBFS

Signal-to-(Noise + Distortion) (SINAD)

f = 1MHz

64

dBFS

f = 10MHz

63

dBFS

f = 31MHz

61

dBFS

Output Noise

Input AC-Grounded

0.13

LSBs rms

Aperture Delay Time

3ns

Aperture Jitter

0.5

ps rms

Over-Voltage Recovery Time

2ns

Full-Scale Step Acquisition Time

5ns

Case Temperature ......................................................................... +100

°C

Junction Temperature .................................................................... +150

°C

Storage Temperature ..................................................................... +150

°C

NOTE: (1) Stresses above those listed under Absolute Maximum Ratings may

cause permanent damage to the device. Exposure to absolute maximum

conditions for extended periods may affect device reliability.

ELECTROSTATIC

DISCHARGE SENSITIVITY

This integrated circuit can be damaged by ESD. Texas Instru-

ments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling

and installation procedures can cause damage.

ESD damage can range from subtle performance degrada-

tion to complete device failure. Precision integrated circuits

may be more susceptible to damage because very small

parametric changes could cause the device not to meet its

published specifications.

SPECIFIED

PACKAGE

TEMPERATURE

PACKAGE

ORDERING

TRANSPORT

PRODUCT

PACKAGE-LEAD

RANGE

MARKING

NUMBER

MEDIA, QUANTITY

ADS809Y

TQFP-48

PHP

–40

°C to +85°C

ADS809Y

ADS809Y/250

Tape and Reel, 250

"

"""

"

ADS809Y/2K

Tape and Reel, 2000

NOTE: (1) For the most current specifications and package information, refer to our web site at www.ti.com.

PACKAGE/ORDERING INFORMATION

NOTES: (1) Spurious-Free Dynamic Range refers to the magnitude of the largest harmonic. (2) dBFS means dB relative to Full-Scale. (3) A 50k

Ω pull-down

resistor is inserted internally. (4) Includes internal reference. (5) Excludes internal reference.