Original Creation Date: 07/10/95

Last Update Date: 02/24/03

Last Major Revision Date: 07/10/95

MNLM129A-X REV 0CL

MICROCIRCUIT DATA SHEET

PRECISION REFERENCE

General Description

The LM129 is a precision multi-current temperature-compensated 6.9V zener reference with

dynamic impedances a factor of 10 to 100 less than discrete diodes. Constructed in a

single silicon chip, the LM129 uses active circuitry to buffer the internal zener allowing

the device to operate over a 0.5 mA to 15 mA range with virtually no change in

performance. The LM129 is available with selected temperature coefficients of 0.001,

0.002, 0.005 and 0.01%/ C. These new references also have excellent long term stability

and low noise.

A new subsurface breakdown zener used in the LM129 gives lower noise and better long-term

stability than coventional IC zeners. Further the zener and temperature compensating

transistor are made by a planar process so they are immune to problems that plague

ordinary zeners. For example, there is virtually no voltage shift in zener voltage due to

temperature cycling and the device is insenstive to stress on the leads.

The LM129 can be used in place of conventional zeners with improved performance. The low

dynamic impedance simplifies biasing and the wide operating current allows the replacement

of may zener types.

The LM129 is packaged in a 2-lead T0-46 package and is rated for operation over a -55 C to

+125 C temperature range.

NS Part Numbers

LM129AH-SMD*

LM129AH/883

Industry Part Number

LM129

Prime Die

LM129

Controlling Document

5962-8992101XA*

Processing

MIL-STD-883, Method 5004

Quality Conformance Inspection

MIL-STD-883, Method 5005

Subgrp Description

Temp ( C)

o

1

Static tests at

+25

2

Static tests at

+125

3

Static tests at

-55

4

Dynamic tests at

+25

5

Dynamic tests at

+125

6

Dynamic tests at

-55

7

Functional tests at

+25

8A

Functional tests at

+125

8B

Functional tests at

-55

9

Switching tests at

+25

10

Switching tests at

+125

11

Switching tests at

-55

1