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AN79L09/M Datasheet(PDF) 2 Page - Panasonic Semiconductor |
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AN79L09/M Datasheet(HTML) 2 Page - Panasonic Semiconductor |
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2 / 12 page ![]() AN79Lxx/AN79LxxM Series 2 SFF00006CEB I Absolute Maximum Ratings at Ta = 25°C I Electrical Characteristics at T a = 25°C • AN79L04 (−4V type) VI PD Topr Tstg V V mW °C °C Parameter Symbol Rating Unit −35 *1 −40 *2 650 *3 −20 to +80 −55 to +150 −55 to +125 Input voltage Power dissipation Operating ambient temperature Storage temperature AN79Lxx series AN79LxxM series *1 AN79L04, AN79L05/M, AN79L06, AN79L07, AN79L08/M, AN79L09/M, AN79L10, AN79L12/M, AN79L15/M, AN79L18 *2 AN79L20, AN79L24 *3 Follow the derating curve. When Tj exceeds 150 °C, the internal circuit cuts off the output. AN79LxxM series is mounted on a standard board (glass epoxy: 20mm × 20mm × t1.7mm with Cu foil of 1cm2 or more). Parameter Symbol Conditions Min Typ Max Output voltage VO V Tj = 25°C Output voltage tolerance VO V VI = −7 to −19V, IO = 1 to 70mA Line regulation REGIN mV VI = −6 to −20V, Tj = 25°C mV Load regulation REGL mV IO = 1 to 100mA, Tj = 25°C mV IO = 1 to 40mA, Tj = 25°C VI = −7 to −17V, Tj = 25°C mA Tj = 25°C Note 1) The specified condition Tj = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, VI = −9V, IO = 40mA, CI = 2µF, CO = 1µF, Tj = 0 to 125°C Bias current IBias mA VI = −7 to −19V, Tj = 25°C Bias current fluctuation to input ∆IBias(IN) mA Bias current fluctuation to load ∆IBias(L) µV IO = 1 to 40mA, Tj = 25°C Output noise voltage Vno dB f = 10Hz to 100kHz, Ta = 25°C Ripple rejection ratio RR VI = −7 to −17V, f = 120Hz, Ta = 25°C V Tj = 25°C Minimum input/output voltage difference VDIF(min) mA Output short-circuit current IO(Short) mV/ °C VI = −35V, Tj = 25°C Output voltage temperature coefficient ∆VO/Ta IO = 5mA Unit −4.16 −4 80 10 3 38 0.5 0.1 40 −4.2 60 30 5 55 −3.84 −3.8 0.8 200 − 0.4 4.5 |
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