1 Features
1• Available in the Texas Instruments
NanoFree™ Package
• Supports 5-V VCC Operation
• Inputs Accept Voltages to 5.5 V
• Supports Down Translation to VCC
• Maximum tpd of 4.2 ns at 3.3 V
• Low Power Consumption, 10-μA Maximum ICC
• ±24-mA Output Drive at 3.3 V
• Ioff Supports Live Insertion, Partial-Power-Down
Mode, and Back-Drive Protection
• Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
• ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)

2 Applications
• Test and Measurement
• Enterprise Switching
• Telecom Infrastructure
• Motor Drives

3 Description
This single positive-edge-triggered D-type flip-flop is
designed for 1.65-V to 5.5-V VCC operation.
When data at the data (D) input meets the setup time
requirement, the data is transferred to the Q output
on the positive-going edge of the clock pulse. Clock
triggering occurs at a voltage level and is not directly
related to the rise time of the clock pulse. Following
the hold-time interval, data at the D input can be
changed without affecting the level at the output.
NanoFree™ package technology is a major
breakthrough in IC packaging concepts, using the die
as the package.
This device is fully specified for partial-power-down
applications using Ioff. The Ioff circuitry disables the
outputs, preventing damaging current backflow
through the device when it is powered down.