| Manufacturer | Part # | Datasheet | Description |
 Agilent(Hewlett-Packard... |
W2635A
|
538Kb / 11P |
BGA Probe Adapter for Infiniium Oscilloscopes
|
 Integrated Device Techn... |
932SQ420D
|
435Kb / 28P |
64-pin TSSOP and MLF packages
|
 Aries Electronics, Inc. |
23023
|
3Mb / 3P |
CSP Test Socket for Optical Laser Failure Analysis w/Emission Microscopy
|
|
24008
|
2Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 13mm Square
|
|
24009
|
1Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 27mm Square
|
|
24009-APP
|
2Mb / 2P |
High-Frequency Center Probe Test Socket with Adj. Pressure Pad for Devices up to 27mm Sq
|
|
24011
|
2Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 40mm Square
|
|
24012
|
1Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 55mm Square
|
|
24013
|
1Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square
|
|
24014
|
3Mb / 3P |
CSP Test Socket for Optical Laser Failure Analysis Emission Microscopy
|