Manufacturer | Part # | Datasheet | Description |
Aries Electronics, Inc. |
24011
|
2Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 40mm Square
|
24008
|
2Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 13mm Square
|
24013
|
1Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 6.5mm Square
|
24009
|
1Mb / 2P |
High-Frequency Center Probe Test Socket for Devices up to 27mm Square
|
24009-APP
|
2Mb / 2P |
High-Frequency Center Probe Test Socket with Adj. Pressure Pad for Devices up to 27mm Sq
|
24010
|
1Mb / 2P |
Machined High-Frequency Center Probe Test Socket for BGA, CSP, & MLF Packages
|
Tyco Electronics |
582118
|
122Kb / 1P |
ASSEMBLY, TEST PROBE
|
Pomona Electronics |
5144
|
30Kb / 1P |
SMD Test Probe
|
6366
|
51Kb / 1P |
Test Lead Set Probe To Retractable Sheath
|
6475
|
37Kb / 2P |
Test Probe Tips For 060 Series Probes
|