AUIRFS/SL3607

7

2016-2-12

 

Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs

Fig 22a. Unclamped Inductive Test Circuit

Fig 22b. Unclamped Inductive Waveforms

Fig 23a. Switching Time Test Circuit

Fig 24a. Gate Charge Test Circuit

Fig 24b. Gate Charge Waveform

R G

IAS

0.01



tp

D.U.T

L

VDS

+

- VDD

DRIVER

A

15V

20V

tp

Fig 23b. Switching Time Waveforms

Vds

Vgs

Id

Vgs(th)

Qgs1 Qgs2

Qgd

Qgodr