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SIM6800M Datasheet(PDF) 27 Page - Sanken electric |
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SIM6800M Datasheet(HTML) 27 Page - Sanken electric |
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27 / 52 page ![]() SIM6800M Series SIM6800M-DSE Rev.1.5 SANKEN ELECTRIC CO., LTD 27 Jul. 18, 2018 http://www.sanken-ele.co.jp/en © SANKEN ELECTRIC CO., LTD. 2014 ● When mounting a heatsink, it is recommended to use silicone greases. If a thermally conductive sheet or an electrically insulating sheet is used, package cracks may be occurred due to creases at screw tightening. Therefore, you should conduct thorough evaluations before using these materials. ● When applying a silicone grease, make sure that there must be no foreign substances between the IC and a heatsink. Extreme care should be taken not to apply a silicone grease onto any device pins as much as possible. The following requirements must be met for proper grease application: - Grease thickness: 100 µm - Heatsink flatness: ±100 µm - Apply silicone grease within the area indicated in Figure 13-2, below. Heatsink Thermal silicone grease application area 1.25 1.25 31.3 Unit: mm 7.4 7.4 M2.5 M2.5 Screw hole Screw hole Figure 13-2. Reference Application Area for Thermal Silicone Grease 13.3 Considerations in IC Characteristics Measurement When measuring the breakdown voltage or leakage current of the transistors incorporated in the IC, note that the gate and emitter (source) of each transistor should have the same potential. Moreover, care should be taken when performing the measurements, because each transistor is connected as follows: ● All the high-side collectors (drains) are internally connected to the VBB pin. ● In the U-phase, the high-side emitter (source) and the low-side collector (drain) are internally connected, and are also connected to the U pin. (In the V- and W-phases, the high- and low-side transistors are unconnected inside the IC.) The gates of the high-side transistors are pulled down to the corresponding output (U, V/V1, and W1) pins; similarly, the gates of the low-side transistors are pulled down to the COM2 pin. When measuring the breakdown voltage or leakage current of the transistors, note that all of the output (U, V/V1, and W1), LSx, and COMx pins must be appropriately connected. Otherwise the switching transistors may result in permanent damage. The following are circuit diagrams representing typical measurement circuits for breakdown voltage: Figure 13-3 shows the high-side transistor (Q1H) in the U-phase; Figure 13-4 shows the low-side transistor (Q1L) in the U-phase. And all the pins that are not represented in these figures are open. When measuring the high-side transistors, leave all the pins not be measured open. When measuring the low-side transistors, connect the LSx pin to be measured to the COMx pin, then leave other unused pins open. W2 U COM2 COM1 W1 V1 VBB V2 LS3B LS2 40 LS3A LS2 V LS1 MIC 16 1 2 24 26 33 35 37 19 Q1H Q1L Q2L Q3L Q2H Q3H V 11 6 31 28 Figure 13-3. Typical Measurement Circuit for High- side Transistor (Q1H) in U-phase W2 U COM2 COM1 W1 V1 VBB V2 LS3B LS2 40 LS3A LS2 V LS1 MIC 16 1 2 24 26 28 33 35 37 19 Q1H Q1L Q2L Q3L Q2H Q3H V 11 6 31 Figure 13-4. Typical Measurement Circuit for Low- side Transistor (Q1L) in U-phase |
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