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USL1602 Datasheet(PDF) 4 Page - Unisonic Technologies |
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USL1602 Datasheet(HTML) 4 Page - Unisonic Technologies |
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4 / 7 page ![]() USL1602 Preliminary CMOS IC UNISONICTECHNOLOGIESCO.,LTD 4 of 7 www.unisonic.com.tw QW-R125-049.a ABSOLUTE MAXIMUM RATING PARAMETER SYMBOL RATINGS UNIT Internal HV MOSFET Drain Voltage VDS -0.3 ~ 600 V VCC Pin Maximum Sink Current ICC MAX 5 mA Line Compensation Pin Input Voltage VLN -0.3 ~ 18 V Internal HV MOSFET Source Voltage VSOURCE -0.3 ~ 18 V Current Sense Pin Input Voltage VCS -0.3 ~ 6 V Power Dissipation PD 0.5 W Operating Junction Temperature TJ -40 ~ +150 °C Storage Temperature Range TSTG -55 ~ +150 °C Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged. Absolute maximum ratings are stress ratings only and functional device operation is not implied. RECOMMENDED OPERATION CONDITIONS PARAMETER SYMBOL RATINGS UNIT Output LED Current ILED <135 mA THERMAL RESISTANCES CHARACTERISTICS PARAMETER SYMBOL RATING UNIT Junction to Ambient θJA 150 °C/W ELECTRICAL CHARACTERISTICS (Notes 1, 2) (Unless otherwise specified, VCC=12V and TA=25°C) PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNIT Supply Voltage Section VCC Clamping Voltage VCC CLAMP 12.5 V VCC Clamping Current IDD CLAMP 5 mA VCC Start Up Voltage VCC ST VCC Rise 7.5 8.3 9.1 V VCC Under Voltage Latch Out Hysteresis VUVLO HYS VCC Falling 1 V Start Up Current IST VCC=VCC ST-0.5V 70 150 µA Operation Current IOP 200 µA Current Sense Section Current Sense Voltage Threshold VCS TH 390 400 410 mV Leading Edge Blanking Time TLEB 350 ns Turn Off Delay Time TDELAY 300 ns Line Compensation Section Line Compensation Rate ∆VCS/∆(VLN-VCC) -40 mV/V Over Temperature Section Thermal Shut Down Temperature TSD 150 °C Thermal Shut Down Hysteresis TSD HYS 30 °C Internal HV MOSFET Switch ON Resistance RDS ON VCC=12V 8 Ω Drain to Source Voltage VDS 600 V Internal Driver Section Minimum Demagnetization Time TOFF MIN 4 µs Maximum Demagnetization Time TOFF MAX 130 µs Maximum Turn On Time TON MAX 45 µs Notes: 1. Production testing of the chip is performed at 25°C. 2. The maximum and minimum parameters specified are guaranteed by test, the typical value are guaranteed by design, characterization and statistical analysis. |
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