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ACCTEE Datasheet(PDF) 4 Page - TOKYO SEIMITSU CO., LTD

Part # ACCTEE
Description  New Measurement Style with New Concept
PDF  11 Pages
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Manufacturer  ACCRETECH [TOKYO SEIMITSU CO., LTD]
Direct Link  http://www.accretech.jp/english/index.html
Logo ACCRETECH - TOKYO SEIMITSU CO., LTD

ACCTEE Datasheet(HTML) 4 Page - TOKYO SEIMITSU CO., LTD

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Surface Texture – Contour
Measuring Instruments
Software
ACCTee, the standard software associated with the SURFCOM DX3 and SD3 series roughness measurement system, is based on a new
concept in roughness measurement that combines document-based measurement and analysis with leading-edge operability and an
intuitive work environment. Setting wizards simplify instrument setup and configuration, making it possible for anyone to easily perform a
variety of measurement and analysis tasks, optimizing throughput and performance.
Versatile Measured Data Analysis
Once imported into ACCTee, measurement data can be
displayed on a preview screen where you can adjust
various measurement conditions (tilt, cut-off filter, etc).
This allows you to optimize measurement conditions and
re-analyze as many times as necessary.
Simple Operation
A Wizard mode guides users through any measurement
operation with easy-to-follow step-by-step instructions.
“Favorite box” collects frequently used commands to
enhance operability.
Display of analysis result after roughness measurement
Roughness Measurement and Analysis System
Functions that Meet Your Needs
Functions such as level difference, area measurement (to
measure PC board thickness), and superimposition (to
compare wear assessments) are included.
Fully Automatic Operation Enhances Operability
Measuring procedures including column up-and-down and
tracing driver movement are automatically registered by
just clicking re-measurement icon.
Data processing software
Roughness Measurement and Analysis System
56
TOKYO SEIMITSU



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