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ACCTEE Datasheet(PDF) 7 Page - TOKYO SEIMITSU CO., LTD

Part # ACCTEE
Description  New Measurement Style with New Concept
PDF  11 Pages
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Manufacturer  ACCRETECH [TOKYO SEIMITSU CO., LTD]
Direct Link  http://www.accretech.jp/english/index.html
Logo ACCRETECH - TOKYO SEIMITSU CO., LTD

ACCTEE Datasheet(HTML) 7 Page - TOKYO SEIMITSU CO., LTD

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Specifications
ACCTee roughness measurement and analysis program
Standard
Complies with JIS2013, JIS2001, JIS1994, JIS1982, ISO2009, ISO1997, ISO1984, DIN1990, ASME2002/1995, CNOMO
Parameter
Ra, Rq, Ry, Rp, Rv, Rc, Rz, Rmax, Rt, Rz.J, R3z, Sm, S, RΔa, RΔq, Rλa, Rλq, TILT A, Ir, Pc, Rsk, Rku, Rk, Rpk, Rvk, Mr1, Mr2,
VO, K, tp, Rmr, Rmr2, Rσc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx,a AR, NR, CPM, SR, SAR, etc
Parameter judgment
The judgment result can be displayed by standard, average value, the maximum value, minimum value, and 16% rule
Evaluation curve
Profile curve, roughness curve, filtered waiveness curve, filtered center line waviness curve, rolling circle waiveness curve,
rolling circle center line waiveness curve, ISO13565-1(DIN4776) roughness curve,
roughness motif curve, waiveness motif curve, envelope waviness curve
Surface characteristic
display
Bearing area curve, power spectrum curve, amplitude distribution graph, ISO13565-2 Bearing area curve, ISO13565-3 Bearing area curve,
peak height distribution graph/list, auto correlation graph, wear-out amount analysis (two arbitrary curves), overlapping analysis (ten curves or less)
Form remove
(tilt correction)
Least square straight line correction, n-dimension polynomial (n=2 to 9) correction, both ends correction,
least square circle correction, least square oval correction, spline correction,
robust (spline) correction (arbitrary or first or latter half of the setting range can be specified for all the options)
Filter type
Gaussian phase compensation filter, phase uncompensation type 2RC filters, phase compensation 2RC filters, spline filter, robust (spline) filter
Filter
Cutoff wavelength (λc): 0.008, 0.025, 0.08, 0.25, 0.8, 2.5, 8, 25, 50 mm (9 levels), arbitrary (from 0.001 mm)
Cutoff ratio (λs): 1/30, 1/100, 1/300, 1/1000, arbitrary (from 1/10)
Cutoff wavelength (λs): 0.08, 0.25, 0.8, 2.5, 8, 25, 80 μm (7 levels), arbitrary (from 0.05)
Stylus calibration
Can be selected from depth specimen (JIS standard), magnification calibration unit, and reference specimen.
Maximum 20 units of stylus calibration information can be registered (deadline for the calibration time can be specified)
Number of data points
300000 max.
Vertical magnification display Arbitrary value (unit: 0.01), automatic and 50, 100, 200, 500, 1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1000 k, 2000 k, 5000 k, 10000 k times
Horizontal magnification display Arbitrary value (unit: 0.01), automatic and 1, 2, 5, 10, 50, 100, 200, 500, 1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1000 k times
Parameters and analysis conditions appropriate for the rough-
ness standard and evaluation purpose can be specified for
ACCTee's measurement AI function. In addition, the optimum
measurement condition can be specified by executing trial
measurement. Analysis items for the measurement data
selected on the document can be displayed by selecting the
display items at the end.
Measurement AI Wizard
Sensitivity calibration is executed by selecting any of the
following three options: depth specimen; magnification calibra-
tion unit; and reference specimen.
Next, the calibration condition is specified (inputting reference
value), the installation method for the calibration unit and the
measurement start position are confirmed, then calibration is
executed.
Pickup Calibration Wizard
Example of measurement AI wizard
Example of pickup calibration wizard
ACCTee can accept any time as the time of calibration. In
addition to the probe replacement time, a calibration alert
based on measurement frequencies or lapsed days is dis-
played, helping maintain accurate and stable measurement by
ensuring periodical calibration.
Calibration Alarm and Historical Management
Abrasion or crack on stylus tip is likely to happen in long-term
use of measurement.Periodic check is essential for precise
measurement.The guidance allows anyone to easily check a
stylus tip.
Stylus check wizard
The same symbols used in the design diagram can be input
into the design values of the analysis condition and parameter
pass/fail judgment.
Parameter Figure and Symbol Input Wizard
Example of parameter figure and symbols wizard
59
TOKYO SEIMITSU



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