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STG25H120F2D7 Datasheet(PDF) 4 Page - STMicroelectronics |
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STG25H120F2D7 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 10 page ![]() Electrical ratings STG25H120F2D7 4/10 DocID027364 Rev 1 2 Electrical ratings Table 3. Absolute maximum ratings (TJ = 25 °C, unless otherwise specified) Symbol Parameter Value Unit VCES Collector-emitter voltage (VGE = 0) 1200 V VGE Gate-emitter voltage ±20 V IC Continuous collector current limited by TJmax 25(1) 1. Depending on thermal properties of assembly . A ICP (1)(2) 2. Pulse width limited by maximum junction temperature. Pulsed collector current, Tp limited by TJmax 75 A tSC (3) 3. Not tested at chip level, verified by design/characterization. Short circuit with stand time VCC= 600 V,VGE= 15 V, TJstart ≤ 150°C 5µs Tj Operating junction temperature - 55 to 175 °C Table 4. Static characteristics (tested on wafer unless otherwise specified) Symbol Parameter Test conditions Min. Typ. Max. Unit VBR(CES) Collector-emitter breakdown voltage IC = 1 mA, VGE = 0 V 1200 V VCE(sat) Collector-emitter saturation voltage VGE = 25 V, IC= 15 A 2.6 V VGE(th) Gate threshold voltage VCE = VGE, IC = 500µA 5 6 7 V IGES Gate-emitter leakage current VGE = ± 20V, VCE = 0 V ± 250 nA ICES Collector cut-off current VCE = 1200 V, VGE= 0 25 µA |
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