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SL2S1502FUD Datasheet(PDF) 21 Page - NXP Semiconductors |
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SL2S1502FUD Datasheet(HTML) 21 Page - NXP Semiconductors |
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21 / 33 page ![]() NXP Semiconductors SL2S1402_SL2S1502_SL2S1602 ICODE ILT SL2S1402_SL2S1502_SL2S1602 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2019. All rights reserved. Product data sheet Rev. 3.3 — 15 October 2019 COMPANY PUBLIC 234333 21 / 33 13 Characteristics 13.1 Memory characteristics Table 15. EEPROM characteristics Symbol Parameter Conditions Min Typ Max Unit tret retention time Tamb ≤ 55 °C 50 - - year Nendu(W) write endurance 100000 - - cycle 13.2 Interface characteristics Table 16. Interface characteristics Typical ratings are not guaranteed. The values listed are at room temperature. Symbol Parameter Conditions Min Typ Max Unit fi input frequency [1] 13.553 13.56 13.567 MHz Vi(RMS)min minimum RMS input voltage operating read/write 1.5 - 1.7 V Pi(min) minimum input power operating [2] - 40 - μW between LA and LB [3] SL2S1402FUx - - - pF SL2S1502FUx 22.3 23.5 24.7 pF Ci input capacitance SL2S1602FUD 92 97 102 pF [1] Bandwidth limitation (± 7 kHz) according to ISM band regulations. [2] Including losses in the resonant capacitor and rectifier. [3] Measured with an HP4285A LCR meter at 13.56 MHz and 2 V RMS. |
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