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TLE4943C Datasheet(PDF) 27 Page - Infineon Technologies AG |
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TLE4943C Datasheet(HTML) 27 Page - Infineon Technologies AG |
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27 / 48 page ![]() TLE4943C Data Sheet 27 V 1.2, July 2018 3 Specification 3.1 Test Circuit Following test circuit is used for evaluating electrical parameters: Figure 20 Test circuit Figure 21 Definition of rise and fall time ΔI refers to 80% positive and negative edges of Ilow to Imid and Ilow to Ihigh and vice versa. Slew rate is calculated by division of ΔI/tr (rise time) or ΔI/tf (fall time). Integratedcap on leads VDD GND Vout Integratedcap on leads DD RM = 50 Ω Vout VS ΔI |
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