PLMP7704HBHSLASHEM datasheet(17/31 Pages) TI

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7.3 Feature Description

7.3.1 Radiation Hardened Performance

Total Ionizing Dose (TID)—The LMP7704-SP is a radiation-hardness-assured (RHA) QML class V (QMLV)

product, and as such it has a total ionizing dose (TID) level specified in the Device Information table on the front

page. Testing and qualification of these products is done on a wafer level according to MIL-STD-883, Test

Method 1019. Radiation lot acceptance testing (RLAT) is performed at the 30-krad, 50-krad, and 100-krad TID

levels.

Group E TID RLAT data are available with lot shipments as part of the QCI summary reports; for information on

finding QCI summary reports, see QML Flow, Its Importance, and Obtaining Lot Information.

Neutron Displacement Damage (NDD)—The LMP7704-SP was irradiated up to 1 × 1012 n/cm2. A sample size

of 15 units was exposed to radiation testing per MILSTD-883, Method 1017 for Neutron Irradiation.

Single-Event Effects (SEE)—One-time SEE characterization was performed according to EIA/JEDEC standard,

EIA/JEDEC57 to linear energy transfer (LET) = 85 MeV

⋅cm2/mg. During testing, no single-event latch-up (SEL)

was observed.

7.3.2 Engineering Model (Devices With /EM Suffix)

Engineering evaluation or engineering model (EM) devices are available for order and are identified by the /EM

in the orderable device name (see the Ordering Information table on the front page of the data sheet). These

devices meet the performance specifications of the data sheet at room temperature only and have not received

the full space production flow or testing. Engineering samples may be QCI rejects that failed tests that would not

impact the performance at room temperature, such as radiation or reliability testing.

7.3.3 Capacitive Load

The LMP7704-SP can each be connected as a non-inverting unity gain follower. This configuration is the most

sensitive to capacitive loading.

The combination of a capacitive load placed on the output of an amplifier along with the amplifier's output

impedance creates a phase lag which in turn reduces the phase margin of the amplifier. If the phase margin is

significantly reduced, the response will be either underdamped or it will oscillate.

To drive heavier capacitive loads, an isolation resistor, RISO, in Figure 7-1 should be used. By using this isolation

resistor, the capacitive load is isolated from the amplifier's output, and hence, the pole caused by CL is no longer

in the feedback loop. The larger the value of RISO, the more stable the output voltage will be. If values of RISO

are sufficiently large, the feedback loop will be stable, independent of the value of CL. However, larger values of

RISO result in reduced output swing and reduced output current drive.

Figure 7-1. Isolating Capacitive Load

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LMP7704-SP

SNOSDB6A – DECEMBER 2020 – REVISED JANUARY 2021

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PLMP7704HBH/EM Datasheet(PDF) 17 Page - Texas Instruments