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DS0147 Datasheet(PDF) 64 Page - Microchip Technology |
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DS0147 Datasheet(HTML) 64 Page - Microchip Technology |
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64 / 128 page ![]() Jtolmin (UI) Max Tx to Rx Fre- quency Offset (ppm) Max Data Rate (M- bps) Min Data Rate (M- bps) I/O Configuration Buffer Type 0.1 ±100 1250 266 LVDS18 HSIO 1, 2 0.1 ±100 1250 266 LVDS25 GPIO 1, 3 1. Jitter tolerance of applied sinusoidal jitter from 1 KHz to 120 MHz, as shown in figure LVDS Jitter Tolerance Plot. It is measured in addition to a stressed eye of Tj= 0.24 UI with VICM of 1.25 V and VIDmin of 250 mV, with the CDR operating at a rate of 1250 Mbps plus or minus the ppm offset listed. 2. HSIO LVDS uses an external 100 Ω differential termination resistor. For more information, see LVDS specification in table Differential DC Input Levels. 3. GPIO LVDS uses an internal 100 Ω differential termination resistor. For more information, see LVDS specification in table Differential DC Input Levels. 6.3 Clocking Specifications This section describes the PLL and DLL clocking and oscillator specifications. 6.3.1 Clocking The following table describes clocking specifications. Table 71 • Global and Regional Clock Characteristics (–40 °C to 100 °C) Condition Unit V DD = 1.05 V –1 V DD = 1.05 V STD V DD = 1.0 V –1 V DD= 1.0 V S- TD Symbol Parameter MHz 500 500 500 500 FMAXG Global clock FMAX Transceiver interfaces on- ly MHz 375 375 375 375 FMAXR Regional clock FMAX All other inter- faces MHz 250 250 250 250 FMAXR At 500 MHz ps 190 190 190 190 TDCDG Global clock duty cycle dis- tortion At 250 MHz ps 120 120 120 120 TDCDR Regional clock duty cy- cle distortion The following table describes clocking specifications from –40 °C to 100 °C. Table 72 • High-Speed I/O Clock Characteristics (–40 °C to 100 °C) Condition Unit VDD = 1.05 V –1 VDD = 1.05 V STD VDD= 1.0 V –1 VDD= 1.0 V ST- D Symbol Parameter HSIO and GPI- O MHz 1250 1000 1250 1000 FMAXB High-speed I/ O clock FMAX 60 Microsemi Proprietary and Confidential. DS0147 Revision 1.0 AC Switching Characteristics |
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