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STF26N65DM2 Datasheet(PDF) 4 Page - STMicroelectronics |
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STF26N65DM2 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 13 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 20 A ISDM(1) Source-drain current (pulsed) - 53 A VSD(2) Forward on voltage VGS = 0 V, ISD = 20 A - 1.6 V trr Reverse recovery time ISD = 20 A, di/dt = 100 A/µs, VDD = 100 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 100 ns Qrr Reverse recovery charge - 0.365 µC IRRM Reverse recovery current - 7.3 A trr Reverse recovery time ISD = 20 A, di/dt = 100 A/µs, VDD = 100 V, TJ = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 200 ns Qrr Reverse recovery charge - 1.39 µC IRRM Reverse recovery current - 13.9 A 1. Pulse width is limited by safe operating area. 2. Pulse test: pulse duration = 300 µs, duty cycle 1.5%. STF26N65DM2 Electrical characteristics DS12426 - Rev 2 page 4/13 |
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