PPJU12P06 / PJD12P06

April 14,2017-REV.00

Page 2

Electrical Characteristics (TA=25

o

C unless otherwise noted)

PARAMETER

SYMBOL

TEST CONDITION

MIN.

TYP.

MAX.

UNITS

Static

Drain-Source Breakdown Voltage

BVDSS

VGS=0V, ID=-250uA

-60

-

-

V

Gate Threshold Voltage

VGS(th)

VDS=VGS, ID=-250uA

-2.0

-2.86

-4.0

Drain-Source On-State Resistance

RDS(on)

VGS=-10V, ID=-6A

-

132

155

m

Ω

Zero Gate Voltage Drain Current

IDSS

VDS=-60V, VGS=0V

-

-

-1.0

uA

Gate-Source Leakage Current

IGSS

VGS=+20V, VDS=0V

-

-

+100

nA

Dynamic

(Note 7)

Total Gate Charge

Qg

VDS=-48V, ID=-12A,

VGS=-10V

(Note 2,3)

-

10.9

-

nC

Gate-Source Charge

Qgs

-

2.7

-

Gate-Drain Charge

Qgd

-

4.0

-

Input Capacitance

Ciss

VDS=-25V, VGS=0V,

f=1.0MHZ

-

385

-

pF

Output Capacitance

Coss

-

158

-

Reverse Transfer Capacitance

Crss

-

31

-

Turn-On Delay Time

td(on)

VDS=-30V, ID=-12A,

VGS=-10V, RG=6Ω

(Note 2,3)

-

4.4

-

ns

Turn-On Rise Time

tr

-

59

-

Turn-Off Delay Time

td(off)

-

20

-

Turn-Off Fall Time

tf

-

36

-

Drain-Source Diode

Maximum Continuous Drain-Source

Diode Forward Current

IS

---

-

-

-12

A

Diode Forward Voltage

VSD

IS=-1A, VGS=0V

-

-0.75

-1

V

Reverse Recovery Time

trr

VGS=0V, IS=-12A

dIF/ dt=100A/us

(Note 2)

-

37

-

ns

Reverse Recovery Charge

Qrr

-

67

-

nC

NOTES :

1.

Pulse width<300us, Duty cycle<2%

2.

Essentially independent of operating temperature typical characteristics

3.

Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and

duty cycles to keep initial TJ =25°C.

4.

The maximum current rating is package limited

5.

RJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is

defined as the solder mounting surface of the drain pins. Mounted on a 1 inch

2 with 2oz.square pad of copper

6.

L=3mH, IAS=-15A, VGS=-10V, VDS=-25V, RG=25 ohm, Starting TJ=25

oC

7.

Guaranteed by design, not subject to production testing.