ACTS373MS

FN4000 Rev 0.00

Page 5 of 10

April 1995

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUP

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Preburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

Interim Test 1 (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

Interim Test 2 (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

PDA

100%/5004

1, 7, 9, Deltas

Interim Test 3 (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

PDA

100%/5004

1, 7, 9, Deltas

Final Test

100%/5004

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/5005

1, 7, 9

NOTE:

1. Alternate Group A testing may be exercised in accordance with MIL-STD-883, Method 5005.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4 (Note 1)

NOTE:

1. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. BURN-IN TEST CONNECTIONS (+125oC < TA < 139oC)

OPEN

GROUND

1/2 VCC = 3V

0.5V

VCC = 6V

0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN 1 (Note 1)

-

1, 3, 4, 7, 8, 10, 11,

13, 14, 17, 18

2, 5, 6, 9, 12, 15, 16, 19

20

-

-

STATIC BURN-IN 2 (Note 1)

-

10

2, 5, 6, 9, 12, 15, 16, 19

1, 3, 4, 7, 8, 11, 13,

14, 17, 18, 20

--

DYNAMIC BURN-IN (Note 1)

-

1, 10

2, 5, 6, 9, 12, 15, 16, 19

20

11

3, 4, 7, 8, 13,

14, 17, 18

NOTE:

1. Each pin except VCC and GND will have a series resistor of 500

 5%.

TABLE 9. IRRADIATION TEST CONNECTIONS (TA = +25oC,

5oC)

FUNCTION

OPEN

GROUND

VCC = 5V

0.5V

Irradiation Circuit (Note 1)

2, 5, 6, 9, 12, 15, 16, 19

10

1, 3, 4, 7, 8, 11, 13, 14, 17, 18, 20

NOTE:

1. Each pin except VCC and GND will have a series resistor of 47k

 5%. Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.