7-962

Specifications CD4063BMS

FIGURE 1. TYPICAL SPEED CHARACTERISTICS OF A 12-BIT COMPARATOR

Interim Test 1 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

Interim Test 2 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Interim Test 3 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

Group A

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 5% parametric, 3% functional; cumulative for static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9, Deltas

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

5-7

1, 2, 4, 8-15

3, 16

Static Burn-In 2

Note 1

5-7

3, 8

1, 2, 4, 9-16

Dynamic Burn-

In Note 1

-

1, 2, 4, 8, 10, 11,

13

3, 16

5-7

12, 15

9, 14

Irradiation

Note 2

5-7

3, 8

1, 2, 4, 9-16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD

= 10V

± 0.5V

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUP

METHOD

GROUP A SUBGROUPS

READ AND RECORD

A0 A1 A2 A3

B0 B1 B2 B3

CD4063

(A < B) IN

(A = B) IN

(A > B) IN

(A < B) OUT

(A = B) OUT

(A > B) OUT

VDD

A4 A5 A6 A7

B4 B5 B6 B7

CD4063

A8 A9 A10 A11

B8 B9 B10 B11

CD4063

tP TOTAL = tP (COMPARE INPUTS) + 2 x tP (CASCADE INPUTS), AT VDD = 10V

(3 STAGES)

= 250 + (2 x 200) = 650ns (TYP.)