Rev X.00

Page 5 of 8

Jan 13, 2017

CD4585BMS

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Interim Test 2 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Interim Test 3 (Post Burn-In)

100% 5004

1, 7, 9

IDD, IOL5, IOH5A

PDA (Note 1)

100% 5004

1, 7, 9, Deltas

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

Group A

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

 -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

3, 12, 13

1, 2, 4 - 11, 14, 15

16

Static Burn-In 2

Note 1

3, 12, 13

8

1, 2, 4 - 7, 9 - 11,

14 - 16

Dynamic Burn-

In Note 1

-

5 - 9, 11, 14, 15

1, 4, 16

3, 12, 13

2

10

Irradiation

Note 2

3, 12, 13

8

1, 2, 4 - 7, 9 - 11,

14 - 16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

 5%, VDD = 18V  0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

 0.5V

TABLE 6. APPLICABLE SUBGROUPS (Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD