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STP80N340K6 Datasheet(PDF) 4 Page - STMicroelectronics |
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STP80N340K6 Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 13 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 12 A ISDM(1) Source-drain current (pulsed) - 28 A VSD(2) Forward on voltage ISD = 12 A, VGS = 0 V - 1.5 V trr Reverse recovery time ISD = 12 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 19. Test circuit for inductive load switching and diode recovery times) - 305 ns Qrr Reverse recovery charge - 4.3 µC IRRM Reverse recovery current - 23 A trr Reverse recovery time ISD = 12 A, di/dt = 100 A/µs, VDD = 60 V, TJ = 150 °C (see Figure 19. Test circuit for inductive load switching and diode recovery times) - 453 ns Qrr Reverse recovery charge - 6 µC IRRM Reverse recovery current - 21 A 1. Pulse width limited by safe operating area. 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5%. STP80N340K6 Electrical characteristics DS14083 - Rev 1 page 4/13 |
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