AS6WA5128 datasheet(3/9 Pages) ALSC

3 / 9 page

AS6WA5128

10/6/00

ALLIANCE SEMICONDUCTOR

Recommended operating condition (over the operating range)

Capacitance (f = 1 MHz, Ta = Room temperature, VCC = NOMINAL)

Parameter

Description

Test Conditions

Min

Max

Unit

VOH

Output HIGH Voltage

IOH = –2.1mA

VCC = 3.0V

2.4

VOL

Output LOW Voltage

IOL = 2.1mA

VCC = 3.0V

0.4

VIH

Input HIGH Voltage

VCC = 3.0V

2.2

VCC + 0.5

VIL

Input LOW Voltage

VCC = 3.0V

–0.5

0.8

IIX

Input Load Current

GND < VIN < VCC

–1

µA

IOZ

Output Load Current

GND < VO < VCC; Outputs High Z

–1

µA

ICC

VCC Operating Supply

Current

CS = VIL,

IOUT = 0mA, f = 0,

VIN = VIL or VIH

VCC = 3.6V

ICC1 @

1MHz

Average VCC Operating

Supply Current at 1

MHz

CS < 0.2V, VIN <

0.2V,

or VIN > VCC – 0.2V,

f = 1 mS

VCC = 3.6V

ICC2

Average VCC Operating

Supply Current

≠ V

IL, VIN = VIL

or VIH, f = fMax

VCC = 3.6V (55 ns)

ISB

CS Power Down

Current; TTL Inputs

CS > VIH, other inputs

= 0V – VCC

VCC = 3.6V

100

µA

ISB1

CS Power Down

Current; CMOS Inputs

CS > VCC – 0.2V,

other inputs = 0V –

VCC, f = fMax

VCC = 3.6V

µA

ISBDR

Data Retention

CS > VCC – 0.1V,

f = 0

VCC = 1.2V

µA

Parameter

Symbol

Signals

Test conditions

Max

Unit

Input capacitance

CIN

A, CS, WE, OE

VIN = 0V

I/O capacitance

CI/O

I/O

VIN = VOUT = 0V

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