Absolute Maximum Ratings

Storage Temperature ...........................

-50°Cto125°C

Operating Temperature ..........................

-40°Cto85°C

Note: These are stress ratings only. Stresses exceeding the range specified under

²Absolute Maximum Ratings² may

cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed

in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.

D.C. Characteristics

Ta=25

°C

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

Conditions

Operating Voltage

¾¾

2.4

3

5

V

Operating Current

5V

No load,

¾

816

mA

Standby Current (WDT Disabled)

5V

No load, System HALT

¾

0

¾mA

I/O Ports Sink Current

5V

9.7

16.2

¾

mA

I/O Ports Source Current

5V

-5.2

-8.7

¾

mA

Pull-High Resistance of I/O Ports

5V

11

22

44

k

W

Input High Voltage for I/O Ports

5V

¾

3.5

¾

5V

Input Low Voltage for I/O Ports

5V

¾

0

¾

1.5

V

Input High Voltage (RES)5V

¾¾

4

¾

V

Input Low Voltage (RES)5V

¾¾

2.5

¾

V

A.C. Characteristics

Ta=25

°C

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

Conditions

MCU interface

System Frequency

5V

12MHz crystal

¾

12

¾

MHz

System Clock

5V

¾

4

¾

16

MHz

Watchdog Time-Out Period (RC)

¾

Without WDT prescaler

9

17

35

ms

External Reset Low Pulse Width

¾¾

1

¾¾

ms

Symbol

Parameter

Figure

Min.

Typ.

Max.

Unit

DAC interface

DCK Bit Clock Frequency

Fig 1

¾

¾

MHz

DCK Bit Clock H Level Time

Fig 1

600

¾¾

ns

Data Output Setup Time

Fig 1

200

¾¾

ns

Data Output Hold Time

Fig 1

200

¾¾

ns

Load Clock Setup Time

Fig 1

200

¾¾

ns

Load Clock Hold Time

Fig 1

200

¾¾

ns

HT36B4

Rev. 1.00

4

October 18, 2006