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DSPIC30F Datasheet(PDF) 182 Page - Microchip Technology |
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DSPIC30F Datasheet(HTML) 182 Page - Microchip Technology |
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182 / 220 page ![]() dsPIC30F5011/5013 DS70116C-page 180 Preliminary 2004 Microchip Technology Inc. TABLE 23-14: INTERNAL CLOCK TIMING EXAMPLES TABLE 23-13: PLL CLOCK TIMING SPECIFICATIONS (VDD = 2.5 TO 5.5 V) AC CHARACTERISTICS Standard Operating Conditions: 2.5V to 5.5V (unless otherwise stated) Operating temperature -40°C ≤ TA ≤ +85°C for Industrial -40°C ≤ TA ≤ +125°C for Extended Param No. Symbol Characteristic(1) Min Typ(2) Max Units Conditions OS50 FPLLI PLL Input Frequency Range(2) 4 — 10 MHz EC, XT modes with PLL OS51 FSYS On-chip PLL Output(2) 16 — 120 MHz EC, XT modes with PLL OS52 TLOC PLL Start-up Time (Lock Time) — 20 50 µs OS53 DCLK CLKOUT Stability (Jitter) TBD 1 TBD % Measured over 100 ms period Note 1: These parameters are characterized but not tested in manufacturing. 2: Data in “Typ” column is at 5V, 25°C unless otherwise stated. Parameters are for design guidance only and are not tested. Clock Oscillator Mode FOSC (MHz)(1) TCY ( µsec)(2) MIPS(3) w/o PLL MIPS(3) w PLL x4 MIPS(3) w PLL x8 MIPS(3) w PLL x16 EC 0.200 20.0 0.05 — — — 4 1.0 1.0 4.0 8.0 16.0 10 0.4 2.5 10.0 20.0 — 25 0.16 25.0 — — — XT 4 1.0 1.0 4.0 8.0 16.0 10 0.4 2.5 10.0 20.0 — Note 1: Assumption: Oscillator Postscaler is divide by 1. 2: Instruction Execution Cycle Time: TCY = 1 / MIPS. 3: Instruction Execution Frequency: MIPS = (FOSC * PLLx) / 4 [since there are 4 Q clocks per instruction cycle]. TABLE 23-15: INTERNAL RC ACCURACY AC CHARACTERISTICS Standard Operating Conditions: 2.5V to 5.5V (unless otherwise stated) Operating temperature -40°C ≤ TA ≤ +85°C for Industrial -40°C ≤ TA ≤ +125°C for Extended Param No. Characteristic Min Typ Max Units Conditions FRC @ Freq = 8 MHz(1) F16 TBD — TBD % -40°C to +85°C VDD =3.3V F19 TBD — TBD % -40°C to +85°C VDD =5V LPRC @ Freq = 512 kHz(2) F20 TBD — TBD % -40°C to +85°C VDD =3V F21 TBD — TBD % -40°C to +85°C VDD =5V Note 1: Frequency calibrated at 25°C and 5V. TUN bits can be used to compensate for temperature drift. 2: LPRC frequency after calibration. 3: Change of LPRC frequency as VDD changes. |
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