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AD5370BSTZ Datasheet(PDF) 5 Page - Analog Devices

Part # AD5370BSTZ
Description  40-Channel, 16-Bit, Serial Input, Voltage-Output DACs
PDF  24 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD5370BSTZ Datasheet(HTML) 5 Page - Analog Devices

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Preliminary Technical Data
AD5370
Rev. P
rr F | Page 5 of 24
Parameter
B Version1
Unit
Test Conditions/Comments2
POWER REQUIREMENTS
DVCC
2.5/5.5
V min/max
VDD
8/16.5
V min/max
VSS
−4.5/−16.5
V min/max
Power Supply Sensitivity2
∆ Full Scale/∆ VDD
−75
dB typ
∆ Full Scale/∆ VSS
−75
dB typ
∆ Full Scale/∆ VCC
−90
dB typ
DICC
2
mA max
VCC = 5.5 V, VIH = VCC, VIL = GND.
IDD
14
mA max
Outputs unloaded. DAC Outputs = 0V
ISS
14
mA max
Outputs unloaded. DAC Outputs = 0V
Power Dissipation
Power Dissipation Unloaded (P)
350
mW
VSS = -5.5 V, VDD = +9.5 V, DVCC = 2.5V
Junction Temperature
130
°C max
TJ = TA + PTOTAL × θJ.3
1 Temperature range for B Version: −40°C to +85°C. Typical specifications are at 25°C.
2 Guaranteed by design and characterization, not production tested.
3 Where
θJ represents the package thermal impedance.
AC CHARACTERISTICS
DVCC = 2.5 V; VDD = 15 V; VSS = −15 V; VREF = 3 V; AGND = DGND = SIGGND = 0 V; CL = 200 pF to GND; RL = 10 kΩ to GNDGain
(m), Offset (c) and DAC Offset registers at default values; all specifications TMIN to TMAX, unless otherwise noted.
Table 3. AC Characteristics
Parameter
B Version1
Unit
Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time
TBD
µs typ
Full-scale change
30
µs max
Slew Rate
1
V/µs typ
Digital-to-Analog Glitch Energy
20
nV-s typ
Glitch Impulse Peak Amplitude
10
mV max
Channel-to-Channel Isolation
100
dB typ
VREF(+) = 2 V p-p, 1 kHz.
DAC-to-DAC Crosstalk
40
nV-s typ
Between DACs inside a group.
10
nV-s typ
Between DACs from different groups.
Digital Crosstalk
0.1
nV-s typ
Digital Feedthrough
1
nV-s typ
Effect of input bus activity on DAC output under test.
Output Noise Spectral Density @ 1 kHz
250
nV/(Hz)1/2 typ
VREF = 0 V.
1 Guaranteed by design and characterization, not production tested.



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