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TAS5186ADDVR Datasheet(PDF) 4 Page - Texas Instruments |
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TAS5186ADDVR Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 18 page ![]() www.ti.com PACKAGE HEAT DISSIPATION RATINGS (1) ABSOLUTE MAXIMUM RATINGS TAS5186A SLES156 – OCTOBER 2005 Table 1. MODE Selection Pins MODE PINS(1) MODE M2 M3 NAME DESCRIPTION 0 0 2.1 mode Channels A, B, and C enabled; channels D, E, and F disabled 0 1 5.1 mode All channels enabled 1 0/1 Reserved (1) M1 must always be connected to GND. 0 indicates a pin connected to GND; 1 indicates a pin connected to VREG. PARAMETER TAS5186ADDV RθJC (°C/W)—1 satellite (sat.) FET only 10.3 RθJC (°C/W)—1 subwoofer (sub.) FET only 5.2 RθJC (°C/W)—1 sat. half-bridge 5.2 RθJC (°C/W)—1 sub. half-bridge 2.6 RθJC (°C/W)—5 sat. half-bridges + 1 sub. 1.74 Typical pad area(2) 34.9 mm2 (1) JC is junction-to-case, CH is case-to-heatsink. (2) RθCH is an important consideration. Assume a 2-mil thickness of typical thermal grease between the pad area and the heatsink. The RθCH with this condition is typically 2°C/W for this package. over operating free-air temperature range (unless otherwise noted)(1) TAS5186A VDD to AGND –0.3 V to 13.2 V GVDD_X to AGND –0.3 V to 13.2 V PVDD_X to PGND_X (2) –0.3 V to 50 V OUT_X to PGND_X (2) –0.3 V to 50 V BST_X to PGND_X (2) –0.3 V to 63.2 V VREG to AGND –0.3 V to 4.2 V PGND to GND –0.3 V to 0.3 V PGND to AGND –0.3 V to 0.3 V GND to AGND –0.3 V to 0.3 V PWM_X, OC_ADJ, M1, M2, M3 to AGND –0.3 V to 4.2 V RESET, SD, OTW to AGND –0.3 V to 7 V Maximum operating junction temperature range (TJ ) 0 to 125°C Storage temperature –40°C to 125°C Lead temperature – 1,6 mm (1/16 inch) from case for 10 seconds 260°C Minimum PWM pulse duration, low 30 ns (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) These voltages represent the dc voltage + peak ac waveform measured at the terminal of the device in all conditions. 4 |
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