CD3206BB datasheet(8/18 Pages) PHILIPS

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Philips Semiconductors

Product specification

FB2031

9-bit latched/registered/pass-thru Futurebus+ transceiver

1995 May 25

DC ELECTRICAL CHARACTERISTICS (Commercial)

Over recommended operating free-air temperature range unless otherwise noted.

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS1

MIN

TYP2

MAX

UNIT

IOH

High level output current

B0 – B8

VCC = MAX, VIL = MAX, VIH = MIN, VOH = 1.9V

100

µA

IOFF

Power-off output current

B0 – B8

VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 1.9V

100

µA

High level output voltage

A8 4

VCC = MIN, VIL = MAX, VIH = MIN, IOH = -24mA

2.0

VOH

High-level output voltage

A0 – A8 4

VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA

2.5

2.85

A0 – A8 4

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA

0.5

Low level output voltage

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 80mA

.75

1.0

1.1

VOL

Low-level output voltage

B0 – B8

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA

1.15

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 4mA

0.5

Control pins

VCC = MIN, II = IIK

-0.5

VIK

Input clamp voltage

A0 – A8

B0 – Bn

VCC = MIN, II = -18mA

-1.2

Input current at maximum

input voltage

Except

B0–B8

VCC = MAX, VI = 0.0V or 5.5V

±50

µA

Hi h l

l i

Except

B0–B8

VCC = MAX, VI = 2.7V

µA

IIH

High-level input current

VCC = MAX, VI = 1.9V

100

µA

B0 – B8

VCC = MAX, VI = 3.5V 5

100

IIL

Low-level input current

Except

B0–B8

VCC = MAX, VI = 0.5V

-20

µA

B0 – B8

VCC = MAX, VI = 0.75V

-100

IIH + IOZH Off-state I/O High current

A0 – A8

VCC = MAX, VO = 2.7V

µA

IIL + IOZL Off-state I/O Low current

A0 – A8

VCC = MAX, VO = 0.5V

-50

µA

IOS

Short-circuit output

current 3

A0 – A8

only

VCC = MAX, VO = 0.0V

-45

-150

An to Bn

VCC = MAX, outputs Low or High

Bn to An

VCC = MAX, outputs Low

ICC

Supply current (total)

Bn to An

VCC = MAX, outputs High

ICCZ

VCC = MAX, outputs 3-State

Worst case

VCC = MAX, all A and B outputs on

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

4. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side.

5. For B port input voltage between 3 and 5 volts IIH will be greater than 100µA, but the parts will continue to function normally.

6. B0 – B8 clamps remain active for a minimum of 80ns following a High-to-Low transition.

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