7

FN3315.1

March 6, 2007

TABLE 3. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 4. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1 (Note 14)

2, 4, 6, 10, 12, 13, 15

3, 5, 7-9, 11-14

1, 16

Static Burn-In 2 (Note 14)

2, 4, 6, 10, 12, 13, 15

8

1, 3, 5, 7, 9, 11, 14, 16

Dynamic Burn-In

(Note 16)

13

8

1, 16

2, 4, 6, 10, 12, 15

3, 5, 7, 9, 11, 14

Irradiation (Note 15)

2, 4, 6, 10, 12, 13, 15, 16

8

1, 3, 5, 7, 9, 11, 14

NOTES:

14. Each pin except pin 1, pin 16, and GND will have a series resistor of 10k

15. Each pin except pin 1, pin 16, and GND will have a series resistor of 47k

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

16. Each pin except pin 1, pin 16, and GND will have a series resistor of 4.75k

Typical Performance Characteristics

FIGURE 2. MINIMUM AND MAXIMUM VOLTAGE TRANSFER

CHARACTERISTICS

FIGURE 3. TYPICAL OUTPUT LOW (SINK) CURRENT

CHARACTERISTICS

5

4

3

2

1

01

2

3

4

INPUT VOLTAGE (VI) (V)

MAXIMUM

MINIMUM

10V

15V

0

30

20

10

40

50

60

12345678

70

CD4049UBMS