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33884 Datasheet(PDF) 8 Page - Freescale Semiconductor, Inc |
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33884 Datasheet(HTML) 8 Page - Freescale Semiconductor, Inc |
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8 / 21 page ![]() Analog Integrated Circuit Device Data 8 Freescale Semiconductor 33884 ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Time from Rising Edge of CS to SO High Impedance (13) tSO(DIS) — 80 110 ns Time from Falling Edge of SCLK to SO Data Valid (14) tVALID — 65 105 ns Recovery Time for Sequential Transfers tREC — 100 120 ns Notes 13 Time required for output states data to be terminated at SO pin. 14 Time required to obtain valid data out from SO following the falling edge of SCLK. Table 4. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 4.75 V ≤ VDD ≤ 5.25 V, 9.0 V ≤ VPWR ≤ 16 V, -40°C ≤ TC ≤ 105°C, unless otherwise noted. Typical values, where applicable, reflect the approximate parameter mean with VPWR = 13 V, TA = 25°C under nominal conditions, unless otherwise noted. Characteristic Symbol Min Typ Max Unit |
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