OP27

Data Sheet

Rev. H | Page 4 of 21

SPECIFICATIONS

ELECTRICAL CHARACTERISTICS

VS = ±15 V, TA = 25°C, unless otherwise noted.

Table 1.

OP27A/OP27E

OP27G

Parameter

Symbol

Test Conditions

Min

Typ

Max

Min

Typ

Max

Unit

INPUT OFFSET VOLTAGE1

VOS

10

25

30

100

µV

LONG-TERM VOS STABILITY2, 3

VOS/Time

0.2

1.0

0.4

2.0

µV/MO

INPUT OFFSET CURRENT

IOS

7

35

12

75

nA

INPUT BIAS CURRENT

IB

±10

±40

±15

±80

nA

INPUT NOISE VOLTAGE3, 4

en p-p

0.1 Hz to 10 Hz

0.08

0.18

0.09

0.25

µV p-p

INPUT NOISE

en

fO = 10 Hz

3.5

5.5

3.8

8.0

nV/√Hz

Voltage Density3

fO = 30 Hz

3.1

4.5

3.3

5.6

nV/√Hz

fO = 1000 Hz

3.0

3.8

3.2

4.5

nV/√Hz

INPUT NOISE

in

fO = 10 Hz

1.7

4.0

1.7

pA/√Hz

Current Density3

fO = 30 Hz

1.0

2.3

1.0

pA/√Hz

fO = 1000 Hz

0.4

0.6

0.4

0.6

pA/√Hz

INPUT RESISTANCE

Differential Mode5

RIN

1.3

6

0.7

4

MΩ

Common Mode

RINCM

3

2

GΩ

INPUT VOLTAGE RANGE

IVR

±11.0

±12.3

±11.0

±12.3

V

COMMON-MODE REJECTION RATIO

CMRR

VCM = ±11 V

114

126

100

120

dB

POWER SUPPLY REJECTION RATIO

PSRR

VS = ±4 V to ±18 V

1

10

2

20

µV/V

LARGE SIGNAL VOLTAGE GAIN

AVO

RL ≥ 2 kΩ, VO = ±10 V

1000

1800

700

1500

V/mV

RL ≥ 600 Ω, VO = ±10 V

800

1500

600

1500

V/mV

OUTPUT VOLTAGE SWING

VO

RL ≥ 2 kΩ

±12.0

±13.8

±11.5

±13.5

V

RL ≥ 600 Ω

±10.0

±11.5

±10.0

±11.5

V

SLEW RATE6

SR

RL ≥ 2 kΩ

1.7

2.8

1.7

2.8

V/µs

GAIN BANDWIDTH PRODUCT6

GBW

5.0

8.0

5.0

8.0

MHz

OPEN-LOOP OUTPUT RESISTANCE

RO

VO = 0, IO = 0

70

70

Ω

POWER CONSUMPTION

Pd

VO

90

140

100

170

mW

OFFSET ADJUSTMENT RANGE

RP = 10 kΩ

±4.0

±4.0

mV

1 Input offset voltage measurements are performed approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.

2 Long-term input offset voltage stability refers to the average trend line of VOS vs. time over extended periods after the first 30 days of operation. Excluding the initial

hour of operation, changes in VOS during the first 30 days are typically 2.5 µV. Refer to the Typical Performance Characteristics section.

3 Sample tested.

4 See voltage noise test circuit (Figure 31).

5 Guaranteed by input bias current.

6 Guaranteed by design.