LMP7721

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SNOSAW6E – JANUARY 2008 – REVISED DECEMBER 2014

6.5 Electrical Characteristics: 2.5 V

Unless otherwise specified, all limits are specified for TA = 25°C, V

+ = 2.5 V, V− = 0 V, V

CM = (V

+ + V−)/2.

PARAMETER

TEST CONDITIONS

MIN(1)

TYP(2)

MAX(1)

UNIT

VOS

Input Offset Voltage

–180

±50

180

μV

–40°C

≤ TJ ≤ 125°C

–480

480

TC VOS

Input Offset Voltage Drift

–1.5

–4

μV/°C

(3)

IBIAS

Input Bias Current

VCM = 1 V

(4) (5)

25°C

–20

±3

20

fA

−40°C to 85°C

–900

900

−40°C to 125°C

–5

5

pA

IOS

Input Offset Current

VCM = 1 V

(5)

±6

±40

fA

CMRR

Common-Mode Rejection Ratio

0 V

≤ VCM ≤ 1.4 V

83

100

dB

0 V

≤ VCM ≤ 1.4 V, –40°C ≤ TJ ≤ 125°C

80

PSRR

Power Supply Rejection Ratio

1.8 V

≤ V+ ≤ 5.5 V, V− = 0 V, VCM = 0

84

92

dB

1.8 V

≤ V+ ≤ 5.5 V, V− = 0 V, VCM = 0,

80

–40°C

≤ TJ ≤ 125°C

CMVR

Input Common-Mode Voltage

CMRR

≥ 80 dB

−0.3

1.5

V

Range

CMRR

≥ 78 dB, –40°C ≤ TJ ≤ 125°C

–0.3

1.5

AVOL

Large Signal Voltage Gain

VO = 0.15 V to 2.2 V, RL = 2 kΩ to V

+/2

88

107

VO = 0.15 V to 2.2 V, RL = 2 kΩ to V

+/2,

82

–40°C

≤ TJ ≤ 125°C

dB

VO = 0.15 V to 2.2 V, RL = 10 kΩ to V

+/2

92

120

VO = 0.15 V to 2.2 V, RL = 10 kΩ to V

+/2,

88

–40°C

≤ TJ ≤ 125°C

VO

Output Swing High

RL = 2 kΩ to V

+/2

70

25

RL = 2 kΩ to V

+/2, –40°C ≤ T

J ≤ 125°C

77

mV

from V+

RL = 10 kΩ to V

+/2

60

20

RL = 10 kΩ to V

+/2, –40°C ≤ T

J ≤ 125°C

66

Output Swing Low

RL = 2 kΩ to V

+/2

30

70

RL = 2 kΩ to V

+/2, –40°C ≤ T

J ≤ 125°C

73

mV

RL = 10 kΩ to V

+/2

15

60

RL = 10 kΩ to V

+/2, –40°C ≤ T

J ≤ 125°C

62

IO

Output Short Circuit Current

Sourcing to V−, VIN = 200 mV

(6)

36

46

Sourcing to V−, VIN = 200 mV

(6), –40°C ≤

30

TJ ≤ 125°C

mA

Sinking to V+, VIN = −200 mV

(6)

7.5

15

Sinking to V+, VIN = −200 mV

(6), –40°C ≤

5.0

TJ ≤ 125°C

IS

Supply Current

1.1

1.5

mA

–40°C

≤ TJ ≤ 125°C

1.75

SR

Slew Rate

AV = +1, Rising (10% to 90%)

9.3

V/

μs

AV = +1, Falling (90% to 10%)

10.8

GBW

Gain Bandwidth Product

15

MHz

en

Input-Referred Voltage Noise

f = 400 Hz

8

nV/

f = 1 kHz

7

(1)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the

Statistical Quality Control (SQC) method.

(2)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped

production material.

(3)

Offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change.

(4)

Positive current corresponds to current flowing into the device.

(5)

This parameter is specified by design and/or characterization and is not tested in production.

(6)

The short circuit test is a momentary open loop test.

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