SN74HC595-EP

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SCLS719 – FEBRUARY 2010

RECOMMENDED OPERATING CONDITIONS

(1)

MIN

NOM

MAX

UNIT

VCC

Supply voltage

2

5

6

V

VCC = 2 V

1.5

VIH

High-level input voltage

VCC = 4.5 V

3.15

V

VCC = 6 V

4.2

VCC = 2 V

0.5

VIL

Low-level input voltage

VCC = 4.5 V

1.35

V

VCC = 6 V

1.8

VI

Input voltage

0

VCC

V

VO

Output voltage

0

VCC

V

VCC = 2 V

1000

Δt/Δv

Input transition rise/fall time(2)

VCC = 4.5 V

500

ns

VCC = 6 V

400

TA

Operating free-air temperature

–55

125

°C

(1)

All unused inputs of the device must be held at VCC or GND to ensure proper device operation. See the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

(2)

If this device is used in the threshold region (from VILmax = 0.5 V to VIHmin = 1.5 V), there is a potential to go into the wrong state from

induced grounding, causing double clocking. Operating with the inputs at tt = 1000 ns and VCC = 2 V does not damage the device;

however, functionally, the CLK inputs are not ensured while in the shift, count, or toggle operating modes.

ELECTRICAL CHARACTERISTICS

over recommended operating free-air temperature range (unless otherwise noted)

TA = 25°C

TA = –55°C to 125°C

PARAMETER

TEST CONDITIONS

VCC

UNIT

MIN

TYP

MAX

MIN

MAX

2 V

1.9

1.998

1.9

IOH = −20 mA

4.5 V

4.4

4.499

4.4

6 V

5.9

5.999

5.9

VOH

VI = VIH or VIL

QH′, IOH = −4 mA

3.98

4.3

3.7

V

4.5 V

QA−QH, IOH = −6 mA

3.98

4.3

3.7

QH′, IOH = −5.2 mA

5.48

5.8

5.2

6 V

QA−QH, IOH = −7.8 mA

5.48

5.8

5.2

2 V

0.002

0.1

0.1

IOL = 20 mA

4.5 V

0.001

0.1

0.1

6 V

0.001

0.1

0.1

VOL

VI = VIH or VIL

QH′, IOL = 4 mA

0.17

0.26

0.4

V

4.5 V

QA−QH, IOL = 6 mA

0.17

0.26

0.4

QH′, IOL = 5.2 mA

0.15

0.26

0.4

6 V

QA−QH, IOL = 7.8 mA

0.15

0.26

0.4

II

VI = VCC or 0

6 V

±0.1

±100

±1000

nA

IOZ

VO = VCC or 0, QA−QH

6 V

±0.01

±0.5

±10

µA

ICC

VI = VCC or 0, IO = 0

6 V

8

160

µA

2 V

Ci

3

10

10

pF

to 6 V

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