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ZL40268 Datasheet(PDF) 40 Page - Microchip Technology |
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ZL40268 Datasheet(HTML) 40 Page - Microchip Technology |
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40 / 56 page ![]() ZL40268 DS20006412C-page 40 2020-2021 Microchip Technology Inc. FIGURE 4-4: Differential Measurement Points for Rise and Fall Time. FIGURE 4-5: Differential Measurement Points for Ringback. FIGURE 4-6: PCIe Test Circuit. slew_rise = 0.3V/trise_edge_rate [V/ns] slew_fall = 0.3V/tfall_edge_rate [V/ns] OUTx_p -OUTx_n OUTx_p - OUTx_n DUT 15 dB loss at 4 GHz 2 pF 5% 2 pF 5% CK CK# Di eren al PCB trace ZDIFF = 100 ±10% Refclk Margins |
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