BurrBrown Products

from Texas Instruments

FEATURES

APPLICATIONS

DESCRIPTION

DAC8830-EP

DAC8831-EP

SGLS334C – AUGUST 2006 – REVISED APRIL 2007

16-Bit, Ultra-Low Power, Voltage-Output

Digital-to-Analog Converters

• Portable Equipment

• Controlled Baseline

• Automatic Test Equipment

–

One Assembly

• Industrial Process Control

–

One Test Site

• Data Acquisition Systems

–

One Fabrication Site

• Optical Networking

• Extended Temperature Performance of –55°C

to 125

°C

• Enhanced Diminishing Manufacturing Sources

The DAC8830 and DAC8831 are single, 16-bit,

(DMS) Support

serial-input,

voltage-output

digital-to-analog

• Enhanced Product-Change Notification

converters (DACs) operating from a single 3-V to 5-V

• Qualification Pedigree (1)

power supply. These converters provide excellent

linearity, low glitch, low noise, and fast settling over

• 16-Bit Resolution

the specified temperature range of –55

°C to 125°C.

• 2.7-V to 5.5-V Single-Supply Operation

The output is unbuffered, which reduces the power

• Low Power: 15 μW for 3-V Power

consumption and the error introduced by the buffer.

• High Accuracy, INL: 1 LSB

These parts feature a standard high-speed (clock up

• Low Glitch: 8 nV-s

to 50 MHz), 3-V or 5-V SPI serial interface to

communicate with the DSP or microprocessors.

• Low Noise: 10 nV/√Hz

• Fast Settling: 1 μs

The DAC8830 output is 0 V to VREF. However, the

DAC8831 provides bipolar mode output (

±V

REF)

• Fast SPI Interface Up to 50 MHz

when working with an external buffer. The DAC8830

• Reset to Zero-Code

and DAC8831 are both reset to zero-code after

• Schmitt-Trigger Inputs for Direct Optocoupler

power up.

Interface

For

optimum

performance,

a

set

of

Kelvin

• Industry-Standard Pin Configuration

connections to external reference and analog ground

input are provided on the DAC8831.

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

The DAC8830 is available in an SO-8 package and

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

the DAC8831 is available in an SO-14 package. Both

temperature cycle, autoclave or unbiased HAST,

have industry standard pinouts (see Table 3, the

electromigration, bond intermetallic life, and mold compound

Cross Reference table in the Application Information

life. Such qualification testing should not be viewed as

section for details).

justifying use of this component beyond specified

performance and environmental limits.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2006–2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.