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SN74LVC4245APWR Datasheet(PDF) 4 Page - Texas Instruments |
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SN74LVC4245APWR Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 26 page ![]() 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range for VCCA = 4.5 V to 5.5 V (unless otherwise noted)(1) MIN MAX UNIT VCCA Supply voltage range –0.5 6.5 V VI Input voltage range A port(2) –0.5 VCCA + 0.5 V Control inputs –0.5 6 VO Output voltage range A port(2) –0.5 VCCA + 0.5 V IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current ±50 mA Continuous current through each VCCA or GND ±100 mA Tstg Storage temperature range –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Section 6.4 is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) This value is limited to 6 V maximum. 6.2 Absolute Maximum Ratings over operating free-air temperature range for VCCB = 2.7 V to 3.6 V (unless otherwise noted)(1) MIN MAX UNIT VCCB Supply voltage range –0.5 4.6 V VI Input voltage range B port(2) –0.5 VCCB + 0.5 V VO Output voltage range B port(2) –0.5 VCCB + 0.5 V IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current ±50 mA Continuous current through VCCB or GND ±100 mA Tstg Storage temperature range –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Section 6.4 is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) This value is limited to 4.6 V maximum. 6.3 ESD Ratings PARAMETER DEFINITION VALUE UNIT V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) 2000 V Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) 1000 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. SN74LVC4245A SCAS375J – MARCH 1994 – REVISED DECEMBER 2022 www.ti.com 4 Submit Document Feedback Copyright © 2022 Texas Instruments Incorporated Product Folder Links: SN74LVC4245A |
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