LMP7717, LMP7718

SNOSAY7H – MARCH 2007 – REVISED MARCH 2013

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2.5V Electrical Characteristics

(1)

Unless otherwise specified, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V, V

CM = V

+/2 = V

O. Boldface limits apply at

the temperature extremes.

Symbol

Parameter

Conditions

Min(2)

Typ(3)

Max(2)

Units

VOS

Input Offset Voltage

±20

±180

µV

±480

TC VOS

Input Offset Voltage Temperature

LMP7717

−1.0

±4

μV/°C

Drift(4) (5)

LMP7718

−1.8

IB

Input Bias Current

VCM = 1.0V

−40°C ≤ TA ≤ 85°C

0.05

1

See (6) and (5)

25

pA

−40°C ≤ TA ≤

0.05

1

125°C

100

IOS

Input Offset Current

VCM = 1.0V

.006

0.5

pA

See(5)

50

CMRR

Common Mode Rejection Ratio

0V

≤ VCM ≤ 1.4V

83

94

dB

80

PSRR

Power Supply Rejection Ratio

2.0V

≤ V+ ≤ 5.5V, VCM = 0V

85

100

80

dB

1.8V

≤ V+ ≤ 5.5V, VCM = 0V

85

98

CMVR

Common Mode Voltage Range

CMRR

≥ 60 dB

−0.3

1.5

V

CMRR

≥ 55 dB

−0.3

1.5

AVOL

Open Loop Voltage Gain

VOUT = 0.15V to

LMP7717

88

98

2.2V,

82

RL = 2 kΩ to V

+/2

LMP7718

84

92

80

dB

VOUT = 0.15V to

LMP7717

92

110

2.2V,

88

RL = 10 kΩ to V

+/2

LMP7718

90

95

86

VOUT

Output Voltage Swing High

RL = 2 kΩ to V

+/2

25

70

77

RL = 10 kΩ to V

+/2

20

60

mV

66

from

either

Output Voltage Swing Low

RL = 2 kΩ to V

+/2

30

70

rail

73

RL = 10 kΩ to V

+/2

15

60

62

IOUT

Output Current

Sourcing to V−

36

47

VIN = 200 mV

30

See(7)

mA

Sinking to V+

7.5

15

VIN = –200 mV

5

See(7)

IS

Supply Current per Amplifier

LMP7717

0.95

1.30

1.65

mA

LMP7718 per channel

1.1

1.5

1.85

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under

conditions of internal self-heating where TJ > TA.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped

production material.

(4)

Offset voltage average drift is determined by dividing the change in VOS by temperature change.

(5)

Parameter is specified by design and/or characterization and is not test in production.

(6)

Positive current corresponds to current flowing into the device.

(7)

The short circuit test is a momentary test, the short circuit duration is 1.5 ms.

4

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