STM32U073RCU6 datasheet(80/146 Pages) STMICROELECTRONICS

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Table 58. Flash memory endurance and data retention

Symbol

Parameter

Conditions

Min(1)

Unit

NEND

Endurance

TA = -40 to +105 °C

kcycles

tRET

Data retention

1 kcycle(2) at TA = 85 °C

Years

1 kcycle(2) at TA = 105 °C

1 kcycle(2) at TA = 125 °C

10 kcycles(2) at TA = 55 °C

10 kcycles(2) at TA = 85 °C

10 kcycles(2) at TA = 105 °C

1. Evaluated by characterization, not tested in production.

2. Cycling performed over the whole temperature range.

6.3.11

EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.

Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the device is stressed

by two electromagnetic events until a failure occurs. The failure is indicated by the LEDs:

•

Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until a functional

disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.

•

FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and VSS through a 100 pF

capacitor, until a functional disturbance occurs. This test is compliant with the IEC 61000-4-4 standard.

A device reset allows normal operations to be resumed.

The test results are given in Table 59. EMS characteristics. They are based on the EMS levels and classes

defined in application note AN1709.

Table 59. EMS characteristics

Symbol

Parameter

Conditions

Level/Class

VFESD

Voltage limits to be applied on any I/O pin to induce a functional

disturbance

VDD = 3.3 V, TA = +25 °C,

fHCLK = 54 MHz, LPQF80

conforming to IEC 61000-4-2

VEFTB

Fast transient voltage burst limits to be applied through 100 pF on VDD

and VSS pins to induce a functional disturbance

VDD = 3.3 V, TA = +25 °C,

fHCLK = 54 MHz, LPQF80

conforming to IEC 61000-4-4

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical application environment

and simplified MCU software. It should be noted that good EMC performance is highly dependent on the user

application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and prequalification tests in relation

with the EMC level requested for his application.

Software recommendations

The software flowchart must include the management of runaway conditions such as:

•

Corrupted program counter

•

Unexpected reset

•

Critical Data corruption (control registers...)

STM32U073x8/B/C

Electrical characteristics

DS14548 - Rev 2

page 80/146

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