TL072IPE4 datasheet(32/89 Pages) TI2

32 / 89 page

8.3 Power Supply Recommendations

CAUTION

Supply voltages larger than 36 V for a single-supply or outside the range of ±18 V for a dual-supply

can permanently damage the device (see Section 5.1).

Place 0.1-μF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or

high-impedance power supplies. For more detailed information on bypass capacitor placement, see Section 8.4.

8.4 Layout

8.4.1 Layout Guidelines

For best operational performance of the device, use good PCB layout practices, including:

• Noise can propagate into analog circuitry through the power pins of the circuit as a whole, as well as the

operational amplifier. Bypass capacitors are used to reduce the coupled noise by providing low impedance

power sources local to the analog circuitry.

– Connect low-ESR, 0.1-μF ceramic bypass capacitors between each supply pin and ground, placed as

close to the device as possible. A single bypass capacitor from VCC+ to ground is applicable for single-

supply applications.

• Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective

methods of noise suppression. One or more layers on multilayer PCBs are typically devoted to ground

planes. A ground plane helps distribute heat and reduces EMI noise pickup. Take care to physically separate

digital and analog grounds, paying attention to the flow of the ground current.

• To reduce parasitic coupling, run the input traces as far away from the supply or output traces as possible.

If not possible, then better to cross the sensitive trace perpendicular as opposed to in parallel with the noisy

trace.

• Place the external components as close to the device as possible. Keeping RF and RG close to the inverting

input minimizes parasitic capacitance; see also Section 8.4.2.

• Keep the length of input traces as short as possible. Always remember that the input traces are the most

sensitive part of the circuit.

• Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce

leakage currents from nearby traces that are at different potentials.

TL071, TL071A, TL071B, TL071H

TL072, TL072A, TL072B, TL072H, TL072M

TL074, TL074A, TL074B, TL074H, TL074M

SLOS080W – SEPTEMBER 1978 – REVISED JULY 2025

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TL072IPE4 Datasheet(PDF) 32 Page - Texas Instruments