TL072IPE4 datasheet(10/89 Pages) TI2

10 / 89 page

5 Specifications

Note

The TLV07xx series has transitioned new die fabrication into a modern process.

This new die is available with an H suffix.

A die with a different suffix is either older or newer; see also Section 9.1.1.

Section 5.7 and Section 5.10 describe the performance of the new die.

Section 5.8, Section 5.9, and Section 5.11 describe the performance of the old die.

5.1 Absolute Maximum Ratings

over operating ambient temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

Supply voltage, VS = (V+) – (V–)

All NS and PS packages; All TL07xM devices

–0.3

All other devices

Signal input

pins

Common-mode

voltage(2)

All NS and PS packages; All TL07xM devices

(VCC–) – 0.3

(VCC–) + 36

All other devices

(VCC–) – 0.5

(VCC+) + 0.5

Differential voltage(2)

All NS and PS packages; All TL07xM devices(3)

(VCC–) – 0.3

(VCC–) + 36

All other devices

VS + 0.2

Current(2)

All NS and PS packages; All TL07xM devices

All other devices

–10

Output short-circuit(4)

Continuous

Operating ambient temperature, TA

–55

150

°C

Junction temperature, TJ

150

°C

Case temperature for 60 seconds - FK package

260

°C

Lead temperature 1.8 mm (1/16 inch) from case for 10 seconds

300

°C

Storage temperature, Tstg

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress

ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under

Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device

reliability.

(2)

Input pins are diode-clamped to both power-supply rails on all new die. Current limit input signals that swing more than 0.5 V beyond

the supply rails to 10 mA or less.

(3)

Differential voltage only limited by input voltage.

(4)

Short-circuit to ground, one amplifier per package.

5.2 ESD Ratings

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

±2000

Charged-device model (CDM), per JEDEC specification JESD22-C101(2)

±1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

TL071, TL071A, TL071B, TL071H

TL072, TL072A, TL072B, TL072H, TL072M

TL074, TL074A, TL074B, TL074H, TL074M

SLOS080W – SEPTEMBER 1978 – REVISED JULY 2025

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Product Folder Links: TL071 TL071A TL071B TL071H TL072 TL072A TL072B TL072H TL072M TL074 TL074A TL074B TL074H TL074M

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