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33883 Datasheet(PDF) 17 Page - Freescale Semiconductor, Inc |
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33883 Datasheet(HTML) 17 Page - Freescale Semiconductor, Inc |
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17 / 21 page ![]() Analog Integrated Circuit Device Data Freescale Semiconductor 17 33883 FUNCTIONAL DEVICE OPERATION PROTECTION AND DIAGNOSTIC FEATURES Figure 13. Limits of C1 Current and Voltage with Large Values of dV/dt In the case of rapidly changing VCC voltages, the large dV/ dt may result in perturbations of the high-side driver, thereby forcing the driver into an OFF state. The addition of capacitors C3 and C4, as shown in Figure 14, reduces the dV/dt of the source line, consequently reducing driver perturbation. Typical values for R3/R4 and C3/C4 are 10 and 10 nF, respectively. DV/DT AT VCC2 When the external high-side MOSFET is on, in case of rapid negative change of VCC2 the voltage (VGATE_HS - VSRC_HS) can be higher than the specified 18 V. In this case a resistance in the SRC line is necessary to limit the current to 5.0 mA max. It will protect the internal zener placed between GATE_HS and SRC pins. In case of high current (SRC_HS>100 mA) and high voltage (>20 V) between GATE_HSX and SRC_HS an external zener of 18 V is needed as shown in Figure 14. tC1max tC1min VCC I(C1+C2) IC1max IC1min V(LR_OUT) 0 V V(C1) 0 A VC1min |
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